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December 1996, Article 2

Firmware Measurement Algorithms for the HP 83480 Digital Communications Analyzer

Parametric measurements measure waveform properties such as rise time, fall time, overshoot, period, and amplitude on either a pulse waveform or an eye diagram. Mask measurements compare the shape of the waveform to a predefined mask. Eye parameter measurements measure properties that are unique to eye diagrams, such as eye height, eye width, jitter, crossing height, and extinction ratio.

by Michael G. Hart, Christopher P. Duff, and Stephen W. Hinch


Article 2 - dec96a2.pdf

Sidebar: HP Eyeline Display Mode - dec96a2a.pdf


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